Nakamura T., Higashikawa K., Kiss T., Izumi T., Shiohara Y., Hasegawa T., Inoue M., Takahashi Y., Koizumi T., Yoshizumi M., Kimura K., Hironaga R.
Higashikawa K., Awaji S., Watanabe K., Kiss T., Izumi T., Hasegawa T., Imamura K., Takahashi Y., Koizumi T., Tanaka K., Yoshizumi M., Kimura K., Inoue M
Ключевые слова: HTS, YGdBCO, coated conductors, pinning centers artificial, TFA-MOD process, long conductors, nanoscaled effects, substrate Hastelloy, IBAD process, critical caracteristics, current-voltage characteristics, critical current, angular dependence, magnetic field dependence, temperature dependence, transport currents, fabrication, experimental results, length
Ключевые слова: HTS, coils, coated conductors, review, Japan, pinning centers artificial, texture, thickness dependence, EuBCO, critical caracteristics, critical current, magnetization, GdBCO
Higashikawa K., Awaji S., Watanabe K., Kiss T., Izumi T., Inoue M., Imamura K., Tanaka K., Taneda T., Yoshizumi M.
Ключевые слова: HTS, GdBCO, coated conductors, IBAD process, critical caracteristics, doping effect, Jc/B curves, pinning force, experimental results
Ключевые слова: presentation, coated conductors, YBCO, REBCO, PLD process, IBAD process, substrate Hastelloy, critical caracteristics, critical current, thickness dependence, Jc/B curves, temperature dependence, pinning centers artificial, microstructure, nanoscaled effects, nanorods, angular dependence, TFA-MOD process, annealing process, grain size, comparison, review, in-field performance
Higashikawa K., Awaji S., Watanabe K., Kiss T., Izumi T., Imamura K., Tanaka K., Yoshizumi M., Inoue M
Kiss T., Izumi T., Shiohara Y., Hasegawa T., Kato T., Hirayama T., Koizumi T., Ibi A., Yoshizumi M., Kimura K., Aoki N.
Awaji S., Izumi T., Shiohara Y., Kato T., Matsumoto K., Ichino Y., Tanaka N., Yoshizumi M., Saitoh K., Tsuruta A., Miura S., Sugihara K., .Ichinose A.
Higashikawa K., Kiss T., Izumi T., Yoshizumi M., Fukuzaki T., Inoue M, Yoshida T., Kamihigoshi M., Uetsuhara D., Nishiura Y.
Higashikawa K., Kiss T., Izumi T., Shiohara Y., Inoue M., Ohmatsu K., Konishi M., Machi T., Yoshizumi M., Shingai Y., Katahira K.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, fabrication, growth rate, thickness dependence
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, annealing process, mechanical properties, laminations, porosity, microstructure, fabrication, experimental results
Ключевые слова: HTS, YBCO, REBCO, TFA-MOD process, doping effect, long conductors, fabrication, reel-to-reel process, thickness dependence
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